The scanning electron microscope coupled with energy dispersive X-ray spectrometer (SEM-EDX) is used for obtaining microstructural images of various types of materials with high magnification and resolution. Thus, information is obtained regarding the degradation states and production techniques of the materials. The measurement of layer thickness of multi-layered samples such as oil and ancient wall paintings is also carried out. The dusty, greasy and organic samples can be examined using the high and low vacuum modes as well as the environmental mode (ESEM) of the microscope. With the large sample chamber, cultural property and artworks with maximum 15x15x6,5 cm dimensions can be analyzed non-destructively without sample coating. The semi-quantitative elemental analysis from the selective areas on the images of the samples is performed and elemental maps can be obtained from these areas by the EDX attachment.
Common application fields:
- Paints and pigments
- Building materials such as mortars, plasters, bricks and cement
- Ceramics and glass
- Wood
- Manuscripts
- Textiles
- Metals
- Polymers
- Biological materials
Instruments
- FEI Quanta FEG 650 Scanning Electron Microscope
- EDAX Energy Dispersive X-ray Spectrometer